Errors and their mitigation at the Kirchhoff-law-Johnson-noise secure key exchange

2013/05/31 by Yessica Saez, Laszlo B. Kish · 2 citations
Computer Science · #cs.ET #cs.CR

paper · pdf · doi:10.1371/journal.pone.0081103

published as PLoS ONE 8 (2013) e81103 · On October 15th, 2013, this version is accepted for publication at PLOS ONE

arxiv created 2013/10/20 · arxiv updated 2013/12/18

Abstract

A method to quantify the error probability at the Kirchhoff-law-Johnson-noise (KLJN) secure key exchange is introduced. The types of errors due to statistical inaccuracies in noise voltage measurements are classified and the error probability is calculated. The most interesting finding is that the error probability decays exponentially with the duration of the time window of single bit exchange. The results indicate that it is feasible to have so small error probabilities of the exchanged bits that error correction algorithms are not required. The results are demonstrated with practical considerations.

Cited by

• A Binary Classifier-Based Wire Resistance Attack on the KLJN Secure Key Exchanger
• Binary Classifier Wire-Resistance Attack on KLJN: Impact of Narrowing the Resistor Gap

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