2013/01/01 by András Kiss, Julia H. Jungmann, Donald F. Smith +1
Chemistry · Engineering · Physics and Astronomy · #Analytical Chemistry (journal) #Chemistry #Detector #Field ion microscope #Integrated Circuits and Semiconductor Failure Analysis #Ion #Ion-surface interactions and analysis #MALDI imaging #Mass Spectrometry Techniques and Applications #Mass spectrometry #Mass spectrometry imaging #Materials science #Microscope #Microscopy #Optics #Physics #Secondary ion mass spectrometry #Selected ion monitoring #physics.ins-det
paper · pdf · doi:10.1063/1.4772396
published as Rev Sci Instrum. 2013 Jan;84(1):013704
openalex publication_date 2013/01/01 · arxiv created 2013/09/04 · arxiv updated 2013/09/05 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05
In-vacuum active pixel detectors enable high sensitivity, highly parallel time- and space-resolved detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined with a secondary ion mass spectrometer for microscope mode secondary ion mass spectrometry (SIMS) imaging. Time resolved images from various benchmark samples demonstrate the imaging capabilities of the detector system. The main advantages of the active pixel detector are the higher signal-to-noise ratio and parallel acquisition of arrival time and position. Microscope mode SIMS imaging of biomolecules is demonstrated from tissue sections with the Timepix detector.