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Probing core-electron orbitals by scanning transmission electron microscopy and measuring the delocalization of core-level excitations

2016/04/26 by Jong Seok Jeong, Michael L. Odlyzko, Peng Xu +2 · 1 citation
Biochemistry, Genetics and Molecular Biology · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Surface and Thin Film Phenomena #Force Microscopy Techniques and Applications

paper · doi:10.1103/physrevb.93.165140

openalex publication_date 2016/04/26 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/01

Abstract

By recording low-noise energy-dispersive x-ray spectroscopy maps from crystalline specimens using aberration-corrected scanning transmission electron microscopy, it is possible to probe core-level electron orbitals in real space. Both the 1s and 2p orbitals of Sr and Ti atoms in SrTiO3 are probed, and their projected excitation potentials are determined. This paper also demonstrates experimental measurement of the electronic excitation impact parameter and the delocalization of an excitation due to Coulombic beam-orbital interaction.

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