Force and conductance during contact formation to a C60molecule

2012/07/13 by Nadine Hauptmann, Fabian Mohn, Leo Gross +3 · 51 citations
Chemistry · Physics and Astronomy · #Advanced Physical and Chemical Molecular Interactions #Atomic force microscopy #Break junction #Conductance #Contact geometry #Force Microscopy Techniques and Applications #Fullerene Chemistry and Applications #Quantum tunnelling #Thermal contact conductance #Ultimate tensile strength #cond-mat.mes-hall #cond-mat.mtrl-sci

paper · pdf · doi:10.1088/1367-2630/14/7/073032

published in New Journal of Physics 14(7), 073032 (IOP Publishing)

openalex publication_date 2012/07/13 · arxiv created 2012/08/14 · arxiv updated 2012/08/15 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05

Abstract

Force and conductance were simultaneously measured during the formation of Cu–C 60 and C 60 –C 60 contacts using a combined cryogenic scanning tunneling and atomic force microscope. The contact geometry was controlled with submolecular resolution. The maximal attractive forces measured for the two types of junctions were found to differ significantly. We show that the previously reported values of the contact conductance correspond to the junction being under maximal tensile stress.

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