Scherrer grain-size analysis adapted to grazing-incidence scattering with area detectors

2009/10/14 by Detlef-M. Smilgies, Detlef‐M. Smilgies · 27 citations
Materials Science · Physics and Astronomy · #X-ray Diffraction in Crystallography #Force Microscopy Techniques and Applications #Corrosion Behavior and Inhibition

paper · pdf · doi:10.1107/s0021889809040126

Abstract

Ever since its formulation, the Scherrer formula has been the workhorse for quantifying finite size effects in X-ray scattering. Various aspects of Scherrer-type grain-size analysis are discussed with regard to the characterization of thin films with grazing-incidence scattering methods utilizing area detectors. After a brief review of the basic features of Scherrer analysis, a description of resolution-limiting factors in grazing-incidence scattering geometry is provided. As an application, the CHESS D1 beamline is characterized for typical scattering modes covering length scales from the molecular scale to the nanoscale.

Citations

• Scherrer after sixty years: A survey and some new results in the determination of crystallite size
• Corrections for surface X-ray diffraction measurements using theZ-axis geometry: finite size effects in direct and reciprocal space

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