GenX: an extensible X-ray reflectivity refinement program utilizing differential evolution

2007/11/10 by Matts Björck, M. Björck, Gabriella Andersson · 33 citations
Materials Science · Physics and Astronomy · #X-ray Diffraction in Crystallography #X-ray Spectroscopy and Fluorescence Analysis #Enzyme Structure and Function

paper · doi:10.1107/s0021889807045086

Abstract

GenX is a versatile program using the differential evolution algorithm for fitting X-ray and neutron reflectivity data. It utilizes the Parratt recursion formula for simulating specular reflectivity. The program is easily extensible, allowing users to incorporate their own models into the program. This can be useful for fitting data from other scattering experiments, or for any other minimization problem which has a large number of input parameters and/or contains many local minima, where the differential evolution algorithm is suitable. In addition, GenX manages to fit an arbitrary number of data sets simultaneously. The program is released under the GNU General Public License.

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