1982/08/01 by A. Albinati, Alberto Albinati, B. T. M. Willis +1 · 112 citations
Chemistry · Materials Science · Physics and Astronomy · #Chemistry #Crystallography #Crystallography and Radiation Phenomena #Diffraction #Materials science #Neutron #Neutron diffraction #Nuclear Physics and Applications #Nuclear physics #Optics #Physics #Powder diffraction #Radiation #Rietveld refinement #Scattering #Wavelength #X-ray #X-ray Diffraction in Crystallography #X-ray crystallography
paper · doi:10.1107/s0021889882012187
published in Journal of Applied Crystallography 15(4), 361-374 (Wiley)
openalex publication_date 1982/08/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/25
In the Rietveld method of analysing powder diffraction data, the crystal structure is refined by fitting the entire profile of the diffraction pattern to a calculated profile. There is no intermediate step of extracting structure factors. The method was applied first to diffraction patterns recorded with neutrons at a fixed wavelength. It has now been used successfully for the treatment of results from the four categories of experimental technique, with neutrons or X-rays as the primary radiation and with the scattered intensity measured at a fixed wavelength or at a fixed scattering angle. In this article we discuss the application of the Rietveld method to each of these techniques.