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Slow Conductance Relaxation in Insulating Granular Al: Evidence for Screening Effects

2011/05/06 by Julien Delahaye, Jean Honoré, Jacques Honoré +2 · 1 citation
Physics and Astronomy · #Amplitude #Condensed matter physics #Conductance #Electric field #Electrical resistivity and conductivity #Field effect #Gate voltage #Materials science #Optics #Physics #Quantum and electron transport phenomena #Quantum mechanics #Relaxation (psychology) #Screening effect #Surface and Thin Film Phenomena #Theoretical and Computational Physics #Transistor #Voltage #cond-mat.dis-nn

paper · pdf · doi:10.1103/physrevlett.106.186602

published as Physical Review Letters 106 (2011) 186602

openalex publication_date 2011/05/06 · arxiv created 2011/06/16 · arxiv updated 2011/06/17 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05

Abstract

It is shown that the conductance relaxations observed in electrical field effect measurements on granular Al films are the sum of two contributions. One is sensitive to gate voltage changes and gives the already reported anomalous electrical field effect. The other one is independent of the gate voltage history and starts when the films are cooled down to low temperature. Their relative amplitude is strongly thickness-dependent which demonstrates the existence of a finite screening length in our insulating films and allows its quantitative estimate (about 10 nm at 4 K). This metalliclike screening should be taken into account in the electron glass models of disordered insulators.

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