2008/06/30 by V. Geringer, Marcus Liebmann, M. Liebmann +12 · 8 citations
Chemistry · Materials Science · Physics and Astronomy · #Amplitude #Analytical Chemistry (journal) #Chemistry #Condensed matter physics #Exfoliation joint #Geology #Graphene #Graphene research and applications #Materials science #Monolayer #Nanotechnology #Optics #Physics #Quantum and electron transport phenomena #Scanning tunneling microscope #Substrate (aquarium) #Surface and Thin Film Phenomena #cond-mat.mtrl-sci
paper · pdf · doi:10.1103/physrevlett.102.076102
published as Phys. Rev. Lett. 102, 076102 (2009) · 10 pages, 11 figures, including supplementary material
arxiv created 2008/11/10 · openalex publication_date 2009/02/17 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05
Using scanning tunneling microscopy in an ultrahigh vacuum and atomic force microscopy, we investigate the corrugation of graphene flakes deposited by exfoliation on a Si/SiO2 (300 nm) surface. While the corrugation on SiO2 is long range with a correlation length of about 25 nm, some of the graphene monolayers exhibit an additional corrugation with a preferential wavelength of about 15 nm. A detailed analysis shows that the long-range corrugation of the substrate is also visible on graphene, but with a reduced amplitude, leading to the conclusion that the graphene is partly freely suspended between hills of the substrate. Thus, the intrinsic rippling observed previously on artificially suspended graphene can exist as well, if graphene is deposited on SiO2.