2007/02/02 by T. van Oudheusden, E. F. de Jong, B. J. Siwick +4 · 4 citations
Biochemistry, Genetics and Molecular Biology · Engineering · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Bunches #Coherence length #Crystallography and Radiation Phenomena #Diffraction #Electron #Electron diffraction #Particle Accelerators and Free-Electron Lasers #Range (aeronautics) #Reflection high-energy electron diffraction #Ultrafast electron diffraction #physics.acc-ph
paper · pdf · doi:10.1063/1.2801027
arxiv created 2007/02/02 · openalex publication_date 2007/11/01 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05
We present a method for producing sub-100 fs electron bunches that are suitable for single-shot ultrafast electron diffraction experiments in the 100 keV energy range. A combination of analytical estimates and state-of-the-art particle tracking simulations show that it is possible to create 100 keV, 0.1 pC, 30 fs electron bunches with a spot size smaller than 500 μm and a transverse coherence length of 3 nm, using established technologies in a table-top setup. The system operates in the space-charge dominated regime to produce energy-correlated bunches that are recompressed by radio-frequency techniques. With this approach we overcome the Coulomb expansion of the bunch, providing a single-shot, ultrafast electron diffraction source concept.