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Size Limit of Defect Formation in Pyramidal Pt Nanocontacts

2007/07/27 by Varlei Rodrigues, Fernando Sato, F. Sato +4
Engineering · Physics and Astronomy · #Molecular Junctions and Nanostructures #Semiconductor materials and devices #Surface and Thin Film Phenomena #cond-mat.mtrl-sci

paper · pdf · doi:10.1103/physrevlett.99.255501

4 pages, 3 figures

arxiv created 2007/07/27 · openalex publication_date 2007/12/19 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/01

Abstract

We report high resolution transmission electron microscopy and ab initio calculation results for defect formation in sharp pyramidal Pt nanocontacts. Our results show that there is a size limit to the existence of twins (extended structural defects). These defects are always present but blocked away from the tip axes. They may act as scattering planes, influencing the electron conductance for Pt nanocontacts at room temperature and Ag/Au nanocontacts at low temperature (<150 K).

Citations