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Investigation of the Casimir force between metal and semiconductor test bodies

2005/05/31 by F. Chen, U. Mohideen, G. L. Klimchitskaya +1
Physics and Astronomy · #Advanced Thermodynamics and Statistical Mechanics #Mechanical and Optical Resonators #Quantum Electrodynamics and Casimir Effect #cond-mat.mtrl-sci #quant-ph

paper · pdf · doi:10.1103/physreva.72.020101

published as Phys. Rev. A, v.72, 020101(R) (2005). · 9 pages, 3 figures; minor abbreviations in the text were made; accepted for publication in Phys. Rev. A (Rapid Communications)

arxiv created 2005/07/08 · openalex publication_date 2005/08/11 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

The measurement of the Casimir force between a large gold coated sphere and single crystal silicon plate is performed with an atomic force microscope. A rigorous statistical comparison of data with theory is done, without use of the concept of root-mean-square deviation, and excellent agreement is obtained. The Casimir force between metal and semiconductor is demonstrated to be qualitatively different than between two similar or dissimilar metals, which opens opportunities for applications in nanotechnology.

Citations