2004/12/17 by Shih‐Lin Chang, S. -L. Chang, Yu. P. Stetsko +10 · 1 citation
Physics and Astronomy · #Advanced X-ray Imaging Techniques #Crystallography and Radiation Phenomena #X-ray Spectroscopy and Fluorescence Analysis #cond-mat.mtrl-sci #cond-mat.other
paper · pdf · doi:10.1103/physrevlett.94.174801
published as Phys. Rev. Lett. 94, 174801 (2005) · 4 pages, 4 figures
arxiv created 2004/12/17 · openalex publication_date 2005/05/05 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/30
X-ray back diffraction from monolithic two silicon crystal plates of 25-150 microm thickness and a 40-150 microm gap using synchrotron radiation of energy resolution DeltaE = 0.36 meV at 14.4388 keV clearly show resonance fringes inside the energy gap and the total-reflection range for the (12 4 0) reflection. This cavity resonance results from the coherent interaction between the x-ray wave fields generated by the two plates with a gap smaller than the x-ray coherence length. This finding opens up new opportunities for high-resolution and phase-contrast x-ray studies, and may lead to new developments in x-ray optics.