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Novel Dielectric Anomaly in the Hole-DopedLa2Cu1−xLixO4andLa2−xSrxNiO4Insulators: Signature of an Electronic Glassy State

2004/04/19 by Tuson Park, Z. Nussinov, Zohar Nussinov +13 · 2 citations
Materials Science · Physics and Astronomy · #Advanced Condensed Matter Physics #Dielectric properties of ceramics #Multiferroics and related materials #cond-mat.str-el #cond-mat.supr-con

paper · pdf · doi:10.1103/physrevlett.94.017002

published as Phys. Rev. Lett. 94, 017002 (2005) · 5 pages, 4 figures

arxiv created 2004/04/19 · openalex publication_date 2005/01/12 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28

Abstract

The low-frequency dielectric response of hole-doped insulators La2Cu_1\ensuremath-xLixO4 and La_2\ensuremath-xSrxNiO4 shows a large dielectric constant \ensuremathε^\ensuremath' at high temperature and a steplike drop by a factor of 100 at a material-dependent low temperature Tf. Tf increases with frequency, and the dielectric response shows universal scaling in a Cole-Cole plot, suggesting that a charge-glass state is realized both in the cuprates and in the nickelates.

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