2003/11/30 by N. Kamakura, Y. Takata, Takashi Tokushima +8
Materials Science · Physics and Astronomy · #Electron and X-Ray Spectroscopy Techniques #Magnetic properties of thin films #X-ray Spectroscopy and Fluorescence Analysis #cond-mat.mtrl-sci #cond-mat.str-el
paper · pdf · doi:10.1209/epl/i2004-10052-6
7 pages, 3 figures Revised text and figure
arxiv created 2004/04/21 · openalex publication_date 2004/07/01 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/30
Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study in-plane band dispersions of nickel as a function of probing depth. Photon energies between h ν = 190 and 780 eV were used to effectively probe up to ∼ 3–7 layers ( ∼ 5–12 Å). The results show layer-dependent band dispersion of the Δ 2↓ minority spin band which crosses the Fermi level in 3 or more layers, in contrast to the known top 1-2 layers dispersion obtained using ultra-violet rays. The layer dependence corresponds to an increased value of exchange splitting and suggests reduced-correlation effects in the bulk compared to the surface.