2003/07/23 by Barbara Drossel, B. Drossel, Mehran Kardar +1 · 1 citation
Engineering · Materials Science · Physics and Astronomy · #Fluid Dynamics and Thin Films #Solidification and crystal growth phenomena #Theoretical and Computational Physics #cond-mat.stat-mech
paper · pdf · doi:10.1140/epjb/e2003-00359-0
10 pages, 8 figures
arxiv created 2003/07/23 · openalex publication_date 2003/12/01 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28
We study the interplay between surface roughening and phase separation during the growth of binary films. Renormalization group calculations are performed on a pair of equations coupling the interface height and order parameter fluctuations. We find a larger roughness exponent at the critical point of the order parameter compared to the disordered phase, and an increase in the upper critical dimension for the surface roughening transition from two to four. Numerical simulations performed on a solid-on-solid model with two types of deposited particles corroborate some of these findings. However, for a range of parameters not accessible to perturbative analysis, we find non-universal behavior with a continuously varying dynamic exponent.