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Pseudomorphic Growth of a Single Element Quasiperiodic Ultrathin Film on a Quasicrystal Substrate

2003/07/07 by J. Ledieu, J. T. Hoeft, J. Hoeft +7 · 6 citations
Earth and Planetary Sciences · Materials Science · Physics and Astronomy · #Mineralogy and Gemology Studies #Quasicrystal Structures and Properties #cond-mat.mtrl-sci

paper · pdf · doi:10.1103/physrevlett.92.135507

published as Phys. Rev. Lett. 92 (2004) 135507 · 4 pages, 4 figs

arxiv created 2003/07/07 · openalex publication_date 2004/04/02 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

An ultrathin film with a periodic interlayer spacing was grown by the deposition of Cu atoms on the fivefold surface of the icosahedral Al70Pd21Mn9 quasicrystal. For coverages from 5 to 25 monolayers, a distinctive quasiperiodic low-energy electron diffraction pattern is observed. Scanning tunneling microscopy images show that the in-plane structure comprises rows having separations of S=4.5\ifmmode±\else\textpm\fi0.2 \AA and L=7.3\ifmmode±\else\textpm\fi0.3 \AA, whose ratio equals \ensuremathτ=1.618… within experimental error. The sequences of such row separations form segments of terms of the Fibonacci sequence, indicative of the formation of a pseudomorphic Cu film.

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