A big data MapReduce framework for fault diagnosis in cloud-based manufacturing

2016/03/04 by Ajay Kumar, Ravi Shankar, Alok Choudhary +1 · 6 citations
Engineering · Computer Science · Decision Sciences · #Industrial Vision Systems and Defect Detection #Imbalanced Data Classification Techniques #Advanced Statistical Process Monitoring

paper · doi:10.1080/00207543.2016.1153166

Abstract

This is an Accepted Manuscript of an article published by Taylor & Francis in International Journal of Production Research on 4th March 2016, available online: http://www.tandfonline.com/10.1080/00207543.2016.1153166.

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