2000/02/10 by C. H. Choo, Chinheng Choo, H. P. Schriemer +2
Physics and Astronomy · #Complex Network Analysis Techniques #Random lasers and scattering media #Theoretical and Computational Physics #cond-mat.dis-nn #cond-mat.stat-mech
paper · pdf · doi:10.1103/physrevb.61.11197
7 pages including 4 figures; To be published in Physical Review B
arxiv created 2000/02/10 · openalex publication_date 2000/05/01 · arxiv updated 2009/11/30 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28
Using birefringence techniques we have measured the critical exponents \ensuremathβ, \ensuremathγ, and \ensuremathδ in As-doped TbVO4, a structural realization of the random-field Ising model where random strain fields are introduced by V-As size mismatch. For pure TbVO4 we observe the expected classical critical exponents, while for a mixed sample with 15% As concentration our results are \ensuremathβ=0.31\ifmmode±\else\textpm\fi0.03, \ensuremathγ=1.22\ifmmode±\else\textpm\fi0.07, and \ensuremathδ=4.2\ifmmode±\else\textpm\fi0.7. These values are consistent with the critical exponents for the short-range pure Ising model in three dimensions in agreement with a prediction by Toh. The susceptibility data showed a crossover with temperature from classical to random-field critical behavior.