1999/02/01 by J. Barnstedt, N. Kappelmann, I. Appenzeller +14 · 30 citations
Engineering · Physics and Astronomy · #Adaptive optics and wavefront sensing #Astronomy #Astronomy and Astrophysical Research #Calibration #Calibration and Measurement Techniques #Cardinal point #Computer science #Data reduction #Full width at half maximum #Grating #Optics #Physics #Spectral line #Spectral resolution #Spectrometer #Telescope #Wavelength #astro-ph
paper · pdf · doi:10.1051/aas:1999156
published in Astronomy & Astrophysics Supplement Series 134(3), 561-567 (EDP Sciences) · 8 pages, 8 figures
openalex publication_date 1999/02/01 · arxiv created 2000/06/21 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05
During the second flight of the ORFEUS-SPAS mission in November/December 1996, the Echelle spectrometer was used extensively by the Principal and Guest Investigator teams as one of the two focal plane instruments of the ORFEUS telescope. We present the in-flight performance and the principles of the data reduction for this instrument. The wavelength range is 90 nm to 140 nm, the spectral resolution is significantly better than λ/Δ λ = 10 000, where Δ λ is measured as FWHM of the instrumental profile. The effective area peaks at 1.3 cm2 near 110 nm. The background is dominated by straylight from the Echelle grating and is about 15% in an extracted spectrum for spectra with a rather flat continuum. The internal accuracy of the wavelength calibration is better than ± 0.005 nm.