1998/07/31 by A. K. Hartmann, A.K. Hartmann, U. Nowak · 75 citations
Mathematics · Physics and Astronomy · #Advanced Condensed Matter Physics #Antiferromagnetism #Critical exponent #Gauss #Ising model #Probability distribution #Scaling #Stochastic processes and statistical mechanics #Theoretical and Computational Physics #Universality (dynamical systems) #cond-mat.stat-mech
paper · pdf · doi:10.1007/s100510050593
published in The European Physical Journal B 7(1), 105-109 (Springer Science+Business Media) · 5 pages, Revtex, 6 Figures included, accepted for Eur.Phys.J.B
arxiv created 1998/09/18 · openalex publication_date 1999/01/01 · arxiv updated 2009/11/30 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05
We investigate the critical behavior of three-dimensional random-field Ising systems with both Gauss and bimodal distribution of random fields and additional the three-dimensional diluted Ising antiferromagnet in an external field. These models are expected to be in the same universality class. We use exact ground-state calculations with an integer optimization algorithm and by a finite-size scaling analysis we calculate the critical exponents nu, beta, and gamma-bar. While the random-field model with Gauss distribution of random fields and the diluted antiferromagnet appear to be in same universality class, the critical exponents of the random-field model with bimodal distribution of random fields seem to be significantly different.