2006/05/01 by Sufian Abedrabbo, S. Abedrabbo, D. E. Arafah +11 · 1 citation
Engineering · #Integrated Circuits and Semiconductor Failure Analysis #Ion-surface interactions and analysis #Semiconductor materials and devices
paper · doi:10.1007/bf02692536
crossref issued 2006/05/01 · crossref published 2006/05/01 · crossref published-print 2006/05/01 · openalex publication_date 2006/05/01 · crossref created 2007/08/25 · crossref deposited 2019/05/20 · openalex created_date 2025/10/10 · crossref indexed 2026/07/14 · openalex updated_date 2026/07/23