1991/01/01 by H. N., Vera Pless · 2 citations
Computer Science · Engineering · #Radiation Effects in Electronics #Software Reliability and Analysis Research #VLSI and Analog Circuit Testing
paper · doi:10.2307/2008564
crossref issued 1991/01/01 · crossref published 1991/01/01 · crossref published-print 1991/01/01 · openalex publication_date 1991/01/01 · crossref created 2006/04/22 · crossref deposited 2018/05/09 · crossref indexed 2022/04/03 · openalex created_date 2025/10/10 · openalex updated_date 2026/06/11