2007/01/23 by N. E. Flowers-Jacobs, Nathan E. Flowers-Jacobs, D. R. Schmidt +1 · 1 citation
Engineering · Physics and Astronomy · #Force Microscopy Techniques and Applications #Mechanical and Optical Resonators #Photonic and Optical Devices #cond-mat.mes-hall #cond-mat.other
paper · pdf · doi:10.1103/physrevlett.98.096804
published as N. E. Flowers-Jacobs, D. R. Schmidt, and K. W. Lehnert, Phys. Rev. Lett. 98, 096804 (2007) · 5 pages, 4 figures, to appear in Physical Review Letters
arxiv created 2007/01/23 · openalex publication_date 2007/03/01 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/30
We measure the noise added by an atomic point contact operated as a displacement detector. With a microwave technique, we increase the measurement speed of atomic point contacts by a factor of 500. The measurement is then fast enough to detect the resonant motion of a nanomechanical beam at frequencies up to 60 MHz and sensitive enough to observe the random thermal motion of the beam at 250 mK. We demonstrate a shot-noise limited imprecision of 2.3 fm/square root[Hz] and observe a 78 aN/square root[Hz] backaction force, yielding a total uncertainty in the beam's displacement that is 42 times the standard-quantum limit.