2008/01/31 by Axel Freyn, Ioannis Kleftogiannis, Jean-Louis Pichard +1
Engineering · Physics and Astronomy · #Atomic physics #Condensed matter physics #Conductance #Electron #Electron microscope #Fermi level #Materials science #Molecular Junctions and Nanostructures #Nanostructure #Nanotechnology #Optics #Physics #Quantum and electron transport phenomena #Quantum mechanics #STRIPS #Scanning confocal electron microscopy #Scanning electron microscope #Scanning gate microscopy #Scanning ion-conductance microscopy #Surface and Thin Film Phenomena #Wavelength #cond-mat.mes-hall
paper · pdf · doi:10.1103/physrevlett.100.226802
published as Phys. Rev. Lett. 100 (2008) 226802-1
openalex publication_date 2008/06/05 · arxiv created 2008/10/07 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05
We show that scanning gate microscopy can be used for probing electron-electron interactions inside a nanostructure. We assume a simple model made of two noninteracting strips attached to an interacting nanosystem. In one of the strips, the electrostatic potential can be locally varied by a charged tip. This change induces corrections upon the nanosystem Hartree-Fock self-energies which enhance the fringes spaced by half the Fermi wavelength in the images giving the quantum conductance as a function of the tip position.