Measurement of Counting Statistics of Electron Transport in a Tunnel Junction

2005/04/30 by Yu. V. Bomze, Yu. Bomze, G. Gershon +5 · 6 citations
Engineering · Physics and Astronomy · #Advancements in Semiconductor Devices and Circuit Design #Quantum and electron transport phenomena #Semiconductor materials and devices #cond-mat.mes-hall

paper · pdf · doi:10.1103/physrevlett.95.176601

published as Phys. Rev. Lett. 95, 176601 (2005) · bibliography expanded

arxiv created 2005/05/05 · openalex publication_date 2005/10/17 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

We present measurements of the time-dependent fluctuations of electrical current in a voltage-biased tunnel junction. We were able to simultaneously extract the first three moments of the current counting statistics. Detailed comparison of the second and the third moments reveals that the statistics is accurately described as Poissonian, expected for spontaneous current fluctuations due to electron charge discreteness, realized in tunneling transport at negligible coupling to environment.

Citations

• Shot noise in mesoscopic conductors
• Temperature-Dependent Third Cumulant of Tunneling Noise

Cited by

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• Proposal for a cumulant-based Bell test for mesoscopic junctions
• Theory of a Josephson junction detector of non-Gaussian noise
• Entanglement entropy from charge statistics: Exact relations for noninteracting many-body systems
• Stochastic Dynamics of a Josephson Junction Threshold Detector
• Full counting statistics and conditional evolution in a nanoelectromechanical system