2007/05/07 by Joseph B. Geddes, Joseph B. Geddes III, Tom G. Mackay +1
Engineering · Materials Science · Physics and Astronomy · #Beam (structure) #Dielectric #Gaussian #Gaussian beam #Materials science #Metamaterials and Metasurfaces Applications #Optics #Optoelectronics #Permittivity #Photonic Crystals and Applications #Photonic and Optical Devices #Physics #Plane wave #Refractive index #Refractive index profile #Slab #Time domain #Total external reflection #physics.class-ph #physics.optics
paper · pdf · doi:10.1016/j.optcom.2007.08.025
published as Opt. Commun., Vol. 280, pp. 120-125 (2007) · manuscript submitted to Optics Communications
arxiv created 2007/05/07 · openalex publication_date 2007/09/05 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05
The refractive index of a dielectric medium comprising both passive and inverted components in its permittivity was determined using two methods: (i) in the time domain, a finite-difference algorithm to compute the frequency-domain reflectance from reflection data for a pulsed plane wave that is normally incident on a dielectric half-space, and (ii) in the frequency domain, the deflection of an obliquely incident Gaussian beam on transmission through a dielectric slab. The dielectric medium was found to be an active medium with a negative real part for its refractive index. Thereby, a recent controversy in the scientific literature was resolved.