2005/11/15 by G. Esen, M. S. Fuhrer · 2 citations
Engineering · Materials Science · Physics and Astronomy · #Atmospheric temperature range #Break junction #Copper Interconnects and Reliability #Electromigration #Joule heating #Junction temperature #Molecular Junctions and Nanostructures #Nanomaterials and Printing Technologies #Nanowire #Temperature control #Thermal #Voltage #cond-mat.mes-hall
paper · pdf · doi:10.1063/1.2149174
published as Applied Physics Letters 87 263101 (2005) · 14 pages,5 figures
arxiv created 2005/11/15 · openalex publication_date 2005/12/19 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05
Controlled electromigration of gold nanowires of different cross-sectional areas to form nanogap junctions is studied using a feedback method. A linear correlation between the cross-sectional area of the gold nanowires and the power dissipated in the junction during electromigration is observed, indicating that the feedback mechanism operates primarily by controlling the temperature of the junction during electromigration. We also show that the role of the external feedback circuit is to prevent thermal runaway; minimization of series resistance allows controlled electromigration to a significant range of junction resistances with a simple voltage ramp.