2007/01/31 by Myoung-Hwan Kim, M. -H. Kim, G. Acbas +16 · 2 citations
Materials Science · Physics and Astronomy · #Condensed matter physics #Faraday effect #Infrared #Magnetic and transport properties of perovskites and related materials #Magnetic field #Multiferroics and related materials #Optical conductivity #Optics #Physics #Quantum mechanics #Reflection (computer programming) #Transmittance #ZnO doping and properties #cond-mat.mtrl-sci #cond-mat.str-el
paper · pdf · doi:10.1103/physrevb.75.214416
published as PhysRevB, 75, 214416 (published 13 June 2007) · LaTeX file 25 pages, 7 figures
arxiv created 2007/04/05 · openalex publication_date 2007/06/13 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05
We present measurement and analysis techniques that allow the complete complex magnetoconductivity tensor to be determined from midinfrared (11--1.6\phantom\rule0.3em0ex\ensuremathμm; 100--800\phantom\rule0.3em0exmeV) measurements of the complex Faraday (\ensuremathθF) and Kerr (\ensuremathθK) angles. Since this approach involves measurement of the geometry (orientation axis and ellipticity of the polarization) of transmitted and reflected light, no absolute transmittance or reflectance measurements are required. Thick-film transmission and reflection equations are used to convert the complex \ensuremathθF and \ensuremathθK into the complex longitudinal conductivity \ensuremathσxx and the complex transverse (Hall) conductivity \ensuremathσxy. \ensuremathθF and \ensuremathθK are measured in a Ga_1\ensuremath-xMnxAs and SrRuO3 films. The resulting \ensuremathσxx is compared to the values obtained from conventional transmittance and reflectance measurements, as well as the results from Kramers-Kronig analysis of reflectance measurements on similar films.