Distance dependence of force and dissipation in non-contact atomic force microscopy on Cu(100) and Al(111)

2004/01/22 by Olivier Pfeiffer, Oliver Pfeiffer, Laurent Nony +4 · 2 citations
Engineering · Physics and Astronomy · #Force Microscopy Techniques and Applications #Mechanical and Optical Resonators #Molecular Junctions and Nanostructures #physics.atm-clus

paper · pdf · doi:10.1088/0957-4484/15/2/021

published as Nanotechnology 15 (2004) S101-S107

openalex publication_date 2004/01/22 · arxiv created 2005/11/17 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/30

Abstract

The dynamic characteristics of a tip oscillating in the nc-AFM mode in close vicinity to a Cu(100)-surface are investigated by means of phase variation experiments in the constant amplitude mode. The change of the quality factor upon approaching the surface deduced from both frequency shift and excitation versus phase curves yield to consistent values. The optimum phase is found to be independent of distance. The dependence of the quality factor on distance is related to 'true' damping, because artefacts related to phase misadjustment can be excluded. The experimental results, as well as on-resonance measurements at different bias voltages on an Al(111) surface, are compared to Joule dissipation and to a model of dissipation in which long-range forces lead to viscoelastic deformations.

Citations

• Advances in atomic force microscopy
• Forces and frequency shifts in atomic-resolution dynamic-force microscopy
• A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy

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