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Charge collection efficiency of irradiated silicon detector operated at cryogenic temperatures

2000/01/01 by K. Borer, S. Janos, Ŝ. Jánoŝ +46 · 3 citations
Engineering · Physics and Astronomy · #CCD and CMOS Imaging Sensors #Particle Detector Development and Performance #Radiation Effects in Electronics

paper · pdf · doi:10.1016/s0168-9002(99)00799-8

crossref issued 2000/01/01 · crossref published 2000/01/01 · crossref published-print 2000/01/01 · openalex publication_date 2000/01/01 · crossref created 2002/07/25 · openalex created_date 2016/06/24 · crossref deposited 2025/09/29 · crossref indexed 2025/10/12 · openalex updated_date 2026/08/01

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