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Soft X-ray resonant magnetic scattering studies on Fe/CoO exchange bias system

2005/05/19 by F. Radu, Florin Radu, Alexei Nefedov +8
Energy · Engineering · Physics and Astronomy · #Characterization and Applications of Magnetic Nanoparticles #Iron oxide chemistry and applications #Magnetic properties of thin films #cond-mat.mtrl-sci

paper · pdf · doi:10.1016/j.jmmm.2005.10.064

published as J. Magn. Magn. Mater. 300 (2006) 206-210 · 5 pages, 4 figures, submitted to J. Magn. Magn. Mater

arxiv created 2005/05/19 · openalex publication_date 2005/11/17 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

We have used soft X-ray Resonant Magnetic Scattering (XRMS) to search for the presence of an effective ferromagnetic moment belonging to the antiferromagnetic (AF) layer which is in close contact with a ferromagnetic (F) layer. Taking advantage of the element specificity of the XRMS technique, we have measured hysteresis loops of both Fe and CoO layers of a CoO(40 Å)/Fe(150 Å) exchange bias bilayer. From these measurements we have concluded that the proximity of the F layer induces a magnetic moment in the AF layer. The F moment of the AF layer has two components: one is frozen and does not follow the applied magnetic field and the other one follows in phase the ferromagnetic magnetization of the F layer. The temperature dependence of the F components belonging to the AF layer is shown and discussed.

Citations