Measurement of the ionization rates in diffused silicon p-n junctions

1970/05/01 by R. Van Overstraeten, H. De Man · 4 citations

paper · doi:10.1016/0038-1101(70)90139-5

crossref issued 1970/05/01 · crossref published 1970/05/01 · crossref published-print 1970/05/01 · crossref created 2002/10/18 · crossref deposited 2019/04/05 · crossref indexed 2026/08/01

Cited by

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