2025/05/13 by Dong Zheng, Christopher N. Young, William F. Stickle · 1 voice
Engineering · Materials Science · #Chalcogenide Semiconductor Thin Films #2D Materials and Applications #Crystal Structures and Properties
paper · doi:10.1116/6.0004441
openalex publication_date 2025/05/13 · openalex created_date 2025/10/10 · openalex updated_date 2026/06/26
Hard x-ray photoelectron spectroscopy using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on sputtered stibnite samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.