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Photon Statistics of Semiconductor Microcavity Lasers

2007/01/25 by S. M. Ulrich, Christopher Gies, Serkan Ateş +7 · 3 citations
Engineering · Physics and Astronomy · #Photonic and Optical Devices #Semiconductor Lasers and Optical Devices #Semiconductor Quantum Structures and Devices

paper · doi:10.1103/physrevlett.98.043906

openalex publication_date 2007/01/25 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/15

Abstract

We present measurements of first- and second-order coherence of quantum-dot micropillar lasers together with a semiconductor laser theory. Our results show a broad threshold region for the observed high-beta microcavities. The intensity jump is accompanied by both pronounced photon intensity fluctuations and strong coherence length changes. The investigations clearly visualize a smooth transition from spontaneous to predominantly stimulated emission which becomes harder to determine for high beta. In our theory, a microscopic approach is used to incorporate the semiconductor nature of quantum dots. The results are in agreement with the experimental intensity traces and the photon statistics measurements.

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