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Frequent Testing vs. Second-chance Testing: An Exploration

2025/07/31 by Geoffrey Herman, Geoffrey L. Herman, Kajal Patel +3 · 1 voice
Computer Science · #Machine Learning and Algorithms #Software Testing and Debugging Techniques #VLSI and Analog Circuit Testing

paper · doi:10.1145/3702652.3744210

openalex publication_date 2025/07/31 · crossref created 2025/07/31 · crossref deposited 2025/07/31 · crossref issued 2025/08/02 · crossref published 2025/08/02 · crossref published-online 2025/08/02 · crossref indexed 2025/08/02 · crossref published-print 2025/08/03 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/29

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