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DetectNano: deep learning detection in TEM images for high-throughput nanostructure characterization

2025/01/01 by Khalid Ferji · 1 voice
Engineering · Materials Science · #Electron and X-Ray Spectroscopy Techniques #Integrated Circuits and Semiconductor Failure Analysis #Machine Learning in Materials Science

paper · pdf · doi:10.1039/d5nr02446c

openalex publication_date 2025/01/01 · openalex created_date 2025/07/16 · openalex updated_date 2026/07/22

Abstract

The rapid and unbiased characterization of self-assembled polymeric vesicles in transmission electron microscopy (TEM) images remains a challenge in polymer science. Here, we present a deep learning-powered detection framework based on YOLOv8, enhanced with Weighted Box Fusion, to automate the identification and size estimation of polymer nanostructures. By incorporating multiple morphologies in the training dataset, we achieve robust detection across unseen TEM images. Our results demonstrate that the model provides accurate vesicle detection within 2 seconds-an efficiency unattainable using traditional image analysis software. The proposed framework enables reproducible and scalable nano-object characterization, paving the way for a general AI-driven automation in polymer self-assembly research.

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