1969/07/01 by S. L. Cundy, A. Howie, U. Valdrè · 1 citation
Biochemistry, Genetics and Molecular Biology · Materials Science · #Advanced Electron Microscopy Techniques and Applications #Electron and X-Ray Spectroscopy Techniques #X-ray Diffraction in Crystallography
paper · doi:10.1080/14786436908228542
crossref issued 1969/07/01 · crossref published 1969/07/01 · crossref published-print 1969/07/01 · openalex publication_date 1969/07/01 · crossref created 2007/07/08 · crossref deposited 2020/04/24 · openalex created_date 2025/10/10 · crossref indexed 2026/07/24 · openalex updated_date 2026/07/29
Observations of the effect of thermal diffuse scattering, single electron excitations and plasmon excitation on the quality of electron microscope images of crystals are presented and discussed. Preservation of image contrast after thermal diffuse scattering seems to be poor in practice but only a small fraction of the electrons accepted by the aperture are affected in this way. To a first approximation, contrast appears to be preserved after single electron excitation or plasmon excitation especially at small scattering angles where no evidence of interband transitions of the fast electron has been found. At larger scattering angles some loss of contrast occurs so that the size of the aperture can be important. The significance of the results is discussed with reference to electron microscopy of thick crystals, direct resolution of atomic positions and out-of-focus images.