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Two-dimensional Dilute Ising Models: Defect Lines and the Universality of the Critical Exponent ν

1999/01/05 by Ferenc Szalma, Ferenc Igloi
Physics and Astronomy · #cond-mat.stat-mech #cond-mat.dis-nn

paper · pdf

published as J. Stat. Phys., 95 (1999) 763 · 4 pages in RevTeX, 4 eps figures included, submitted to J. Stat. Phys

arxiv created 1999/01/05 · arxiv updated 2009/11/30

Abstract

We consider two-dimensional Ising models with randomly distributed ferromagnetic bonds and study the local critical behavior at defect lines by extensive Monte Carlo simulations. Both for ladder and chain type defects, non-universal critical behavior is observed: the critical exponent of the defect magnetization is found to be a continuous function of the strength of the defect coupling. Analyzing corresponding stability conditions, we obtain new evidence that the critical exponent ν of the bulk correlation length of the random Ising model does not depend on dilution, i.e. ν=1.

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