2005/01/19 by M. Herz, Ch. Schiller, F. J. Giessibl +1
Physics and Astronomy · #cond-mat.mtrl-sci
paper · pdf · doi:10.1063/1.1900316
published as Appl. Phys. Lett. 86, 153101 (2005) · 8 pages, 4 figures, submitted to Applied Physics Letters
arxiv created 2005/01/19 · arxiv updated 2009/12/01
The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work function and tip-sample forces. A combined dynamic scanning tunneling microscope and atomic force microscope is used to measure the tunneling current between an oscillating tip and the sample in real time as a function of the cantilever's deflection. Atomically resolved work function measurements on a silicon (111)-(7× 7) surface are presented and related to concurrently recorded tunneling current- and force- measurements.