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Parity measurement of one- and two-electron double well systems

2004/10/07 by Thomas M. Stace, T. M. Stace, S. D. Barrett +3 · 2 citations
Computer Science · Physics and Astronomy · #Quantum Information and Cryptography #Quantum and electron transport phenomena #Surface and Thin Film Phenomena #cond-mat.mes-hall #quant-ph

paper · pdf · doi:10.1103/physrevb.70.205342

published as Phys. Rev. B 70, 205342 (2004) · 18 Pages, to appear in PRB

arxiv created 2004/10/07 · openalex publication_date 2004/11/29 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/30

Abstract

We outline a scheme to accomplish measurements of a solid state double well system (DWS) with both one and two electrons in nonlocalized bases. We show that, for a single particle, measuring the local charge distribution at the midpoint of a DWS using a SET as a sensitive electrometer amounts to performing a projective measurement in the parity (symmetric/antisymmetric) eigenbasis. For two-electrons in a DWS, a similar configuration of SET results in close-to-projective measurement in the singlet/triplet basis. We analyze the sensitivity of the scheme to asymmetry in the SET position for some experimentally relevant parameter, and show that it is experimentally realizable.

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