Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape

2003/09/30 by I. Kuljanishvili, Subhasish Chakraborty, I . J. Maasilta +2
Physics and Astronomy · #cond-mat.mes-hall #cond-mat.mtrl-sci

paper · pdf

published as Ultramicroscopy, Volume 102, Issue 1, December 2004, Pages 7-12 · 5 pages, 3 figures

arxiv created 2004/11/22 · arxiv updated 2009/12/01

Abstract

We present a numerical method to model electric field sensitive scanning probe microscopy measurements which allows for a tip of arbtrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.

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