2002/08/31 by L. Roters, S. Lubeck, K. D. Usadel
Physics and Astronomy · #cond-mat.stat-mech
published as Phase Transitions 75, 257 (2002) · some misprints corrected
arxiv created 2002/10/14 · arxiv updated 2009/11/30
We consider numerically the depinning transition in the random-field Ising model. Our analysis reveals that the three and four dimensional model displays a simple scaling behavior whereas the five dimensional scaling behavior is affected by logarithmic corrections. This suggests that d=5 is the upper critical dimension of the depinning transition in the random-field Ising model. Furthermore, we investigate the so-called creep regime (small driving fields and temperatures) where the interface velocity is given by an Arrhenius law.