X-Ray Diffraction Measurements on Metallic and Semiconducting Hexagonal NiS

1970/10/15 by Jeffrey Trahan, Jeffrey F. Trahan, R. G. Goodrich +2 · 1 citation
Materials Science · #Transition Metal Oxide Nanomaterials #2D Materials and Applications #Magnetic and transport properties of perovskites and related materials

paper · doi:10.1103/physrevb.2.2859

Abstract

The crystallographic structure of hexagonal NiS has been determined at temperatures above and below the metal-semiconducting transition. The powder x-ray diffraction peak intensities were used to determine the atom positions in both phases. The symmetry of the unit cell is found to change from \fracP6₃mmc(D_6h^⁴) in the metallic phase to P6₃mc(C_6v⁴) in the semiconducting phase.

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• Electronic structure ofNiS1−xSex

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