Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process

2022/06/10 by D. Jannis, Daen Jannis, Abner Velazco +5 · 4 citations
Biochemistry, Genetics and Molecular Biology · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Electron and X-Ray Spectroscopy Techniques #X-ray Spectroscopy and Fluorescence Analysis

paper · doi:10.1016/j.ultramic.2022.113568

openalex publication_date 2022/06/10 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/29

Cited by

• Advancing Time-Resolved Spectroscopies with Custom Scanning Units and Event-Based Electron Detection
• Programmable Beam Control for Electron Energy-Loss Spectroscopy and Ptychography
• Fast Simulation of Damage Diffusion Distribution in Scanning Transmission Electron Microscopy
• Removing constraints of 4D-STEM with a framework for event-driven acquisition and processing