Towards high accuracy calibration of electron backscatter diffraction systems

2011/01/19 by Ken Mingard, Austin Day, A. P. Day +3 · 2 citations
Materials Science · Engineering · Computer Science · #Electron and X-Ray Spectroscopy Techniques #Non-Destructive Testing Techniques #Optical measurement and interference techniques

paper · doi:10.1016/j.ultramic.2011.01.012

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