Orientation mapping by transmission-SEM with an on-axis detector

2015/11/10 by J.J. Fundenberger, Emmanuel Bouzy, E. Bouzy +8 · 3 citations
Materials Science · Biochemistry, Genetics and Molecular Biology · Engineering · #Electron and X-Ray Spectroscopy Techniques #Advanced Electron Microscopy Techniques and Applications #Advancements in Photolithography Techniques

paper · doi:10.1016/j.ultramic.2015.11.002

Citations

• Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope

Cited by

• Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope
• Electron Backscattered Diffraction using a New Monolithic Direct Detector: High Resolution and Fast Acquisition
• Dynamical simulation of on‐axis transmission Kikuchi and spot diffraction patterns, based on accurate diffraction geometry calibration