2017/01/31 by Stefan Löffler, Matthieu Bugnet, Nicolas Gauquelin +6 · 1 citation
Engineering · Materials Science · #Electron and X-Ray Spectroscopy Techniques #Electronic and Structural Properties of Oxides #Semiconductor materials and devices
paper · doi:10.1016/j.ultramic.2017.01.018
openalex publication_date 2017/01/31 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/31