Scattering delocalization and radiation damage in STEM-EELS

2017/04/01 by R.F. Egerton · 3 citations
Engineering · Materials Science · #Advancements in Photolithography Techniques #Electron and X-Ray Spectroscopy Techniques #Integrated Circuits and Semiconductor Failure Analysis

paper · doi:10.1016/j.ultramic.2017.02.007

openalex publication_date 2017/04/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/29

Citations

• Delocalization in inelastic scattering
• The spatial resolution of imaging using core-loss spectroscopy in the scanning transmission electron microscope
• Mechanisms of radiation damage in beam‐sensitive specimens, for TEM accelerating voltages between 10 and 300 kV

Cited by

• Advances in momentum-resolved EELS of phonons, excitons and plasmons in 2D materials and their heterostructures
• Imaging Nanoscale Carrier, Thermal, and Structural Dynamics with Time-Resolved and Ultrafast Electron Energy-Loss Spectroscopy
• Identification of site-specific isotopic labels by vibrational spectroscopy in the electron microscope