Electron mean-free-path calculations using a model dielectric function

1987/01/15 by David R. Penn · 5 citations
Engineering · Materials Science · Physics and Astronomy · #Electron and X-Ray Spectroscopy Techniques #Semiconductor materials and devices #Surface and Thin Film Phenomena

paper · doi:10.1103/physrevb.35.482

openalex publication_date 1987/01/15 · openalex created_date 2016/06/24 · openalex updated_date 2026/06/27

Abstract

The inelastic electron mean free path as a function of energy is calculated for Cu, Ag, Au, and Al. The calculations are based on a model dielectric function \ensuremathε(q,\ensuremathω), which is obtained from a modification of the statistical approximation. In this approach \ensuremathε(0,\ensuremathω) is determined by the experimentally measured optical dielectric function. Calculated mean free paths are compared to experimental data and to other theories.

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